SHINEWAYTECH



Trademark Coverage

No Class Specified

An optical metrology inspection system comprised of a light source, one or more cameras and sensors in communication with computer software and hardware; Battery testers; Circuit testers; Electrical outlet tester; Electro-optical instruments for use in inspection and measurement of industrial components; Electronic and optical communications instruments and components, namely, communication link testers for testing communication links; Electronic frequency converters for high velocity electro motors; Electronic ultrasonic test equipment, namely, ultrasonic flaw detectors, thickness testers and hardness testers, for non-medical use; Experimental devices in the field of fusion technologies, namely, cryostats; Experimental devices in the field of fusion technologies, namely, poloidal diverters; Experimental devices in the field of fusion technologies, namely, superconducting poloidals; Experimental devices in the field of fusion technologies, namely, superconducting toroidals; Laser measuring systems; Laser rangefinders; Laser scanners for industrial inspection; Lasers for industrial use; Lasers for measuring purposes; Lasers for non-medical purposes; Lasers not for medical use; Measuring apparatus, namely, laser distance meters; Microhardness testers; Portable detection and identification instruments using light sources and light detectors for detecting and identifying chemical and biological substances not for medical purposes

Owner

SHINEWAY TECHNOLOGIES, INC.

Business in Haidian Beijing, CN

Owns 1 trademark

Timeline
  • Sep 10
    2013
    Registered Principal Register
  • Jun 25
    2013
    Official Gazette Publication Confirmation E Mailed
  • Jun 25
    2013
    Published For Opposition
  • Jun 05
    2013
    Notification Of Notice Of Publication E Mailed
  • May 17
    2013
    Approved For PUB Principal Register
  • May 10
    2013
    Assigned To Examiner
  • Feb 06
    2013
    Notice Of Pseudo Mark E Mailed
  • Feb 05
    2013
    New Application Office Supplied Data Entered In TRAM
  • Feb 01
    2013
    New Application Entered In TRAM