YDPLATING



Trademark Coverage

No Class Specified

Probe-pins for measuring electrical properties of a specific portion of semiconductors through a process of semiconductor inspection; Probes for measuring electrical properties of a specific portion of semiconductors through a process of semiconductor inspection in the nature of an elastic biasing component using the connecting portion by means of the coil spring; Integrated circuit sockets; Probes for testing semiconductors; Probe cards for testing semiconductors; Semiconductor testing apparatus; Probes for testing liquid crystal displays; Probe cards for testing liquid crystal displays; Apparatus for testing liquid crystal displays

Owner
Timeline
  • Oct 08
    2013
    Abandonment Notice Mailed Failure To Respond
  • Oct 08
    2013
    Abandonment Failure To Respond Or Late Response
  • Feb 26
    2013
    Notification Of Non Final Action E Mailed
  • Feb 26
    2013
    Non Final Action E Mailed
  • Feb 26
    2013
    Non Final Action Written
  • Feb 25
    2013
    Assigned To Examiner
  • Nov 27
    2012
    Applicant Amendment Prior To Examination Entered
  • Nov 25
    2012
    Assigned To LIE
  • Nov 15
    2012
    TEAS Voluntary Amendment Received
  • Nov 02
    2012
    Notice Of Pseudo Mark Mailed
  • Nov 01
    2012
    New Application Office Supplied Data Entered In TRAM
  • Oct 29
    2012
    New Application Entered In TRAM