WAFERSTUDIO



Trademark Coverage

No Class Specified

Design and development of computer software, used in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings; installation, maintenance and updating of computer software in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings

Owner

E+H Metrology GmbH

Business in 76185 Karlsruhe, DE

Owns 1 trademark

Timeline
  • Feb 13
    2013
    Final Decision Transaction Processed By IB
  • Oct 24
    2012
    Death Of International Registration
  • Nov 01
    2010
    Final Disposition Notice Sent To IB
  • Nov 01
    2010
    Final Disposition Processed
  • Oct 27
    2010
    Final Disposition Notice Created, To Be Sent To IB
  • Jul 27
    2010
    Registered Principal Register
  • May 11
    2010
    Published For Opposition
  • Apr 21
    2010
    Notice Of Publication
  • Apr 08
    2010
    Law Office Publication Review Completed
  • Apr 08
    2010
    Assigned To LIE
  • Mar 22
    2010
    Approved For PUB Principal Register
  • Mar 17
    2010
    TEAS/Email Correspondence Entered
  • Mar 17
    2010
    Correspondence Received In Law Office
  • Mar 17
    2010
    TEAS Response To Office Action Received
  • Mar 17
    2010
    Fax Received
  • Mar 17
    2010
    Fax Received
  • Oct 16
    2009
    Refusal Processed By IB
  • Sep 21
    2009
    Non Final Action Mailed Refusal Sent To IB
  • Sep 21
    2009
    Refusal Processed By MPU
  • Sep 19
    2009
    Non Final Action (IB Refusal) Prepared For Review
  • Sep 18
    2009
    Non Final Action Written
  • Sep 15
    2009
    Application Filing Receipt Mailed
  • Sep 11
    2009
    Assigned To Examiner
  • Sep 11
    2009
    New Application Office Supplied Data Entered In TRAM
  • Sep 10
    2009
    SN Assigned For SECT 66 A APPL From IB