WAFERSTUDIO



Trademark Coverage

Computers, Software, Electronic instruments, & Scientific appliances

Design and development of computer software, used in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings; installation, maintenance and updating of computer software in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings

Owner

E+H Metrology GmbH

Business in 76185 Karlsruhe, DE

Owns 1 trademark

Timeline
  • Feb 13
    2013
    Final Decision Transaction Processed By IB
  • Oct 24
    2012
    Death Of International Registration
  • Nov 01
    2010
    Final Disposition Notice Sent To IB
  • Nov 01
    2010
    Final Disposition Processed
  • Oct 27
    2010
    Final Disposition Notice Created, To Be Sent To IB
  • Jul 27
    2010
    Registered Principal Register
  • May 11
    2010
    Published For Opposition
  • Apr 21
    2010
    Notice Of Publication
  • Apr 08
    2010
    Law Office Publication Review Completed
  • Apr 08
    2010
    Assigned To LIE
  • Mar 22
    2010
    Approved For PUB Principal Register
  • Mar 17
    2010
    TEAS/Email Correspondence Entered
  • Mar 17
    2010
    Correspondence Received In Law Office
  • Mar 17
    2010
    TEAS Response To Office Action Received
  • Mar 17
    2010
    Fax Received
  • Mar 17
    2010
    Fax Received
  • Oct 16
    2009
    Refusal Processed By IB
  • Sep 21
    2009
    Non Final Action Mailed Refusal Sent To IB
  • Sep 21
    2009
    Refusal Processed By MPU
  • Sep 19
    2009
    Non Final Action (IB Refusal) Prepared For Review
  • Sep 18
    2009
    Non Final Action Written
  • Sep 15
    2009
    Application Filing Receipt Mailed
  • Sep 11
    2009
    Assigned To Examiner
  • Sep 11
    2009
    New Application Office Supplied Data Entered In TRAM
  • Sep 10
    2009
    SN Assigned For SECT 66 A APPL From IB