ELIONIX



Trademark Coverage

No Class Specified

Microscope; surface roughness analyzer; electron beam lithography machine; electron probe micro analyzer; ion beam etching machine; plasma etching and deposition machine; indentation tester; focused ion beam etching machine

Owner

Elionix Inc.

Business in Hachiouji-city, Tokyo, JP

Owns 1 trademark

Timeline
  • Oct 17
    2013
    Notice Of Acceptance Of SEC 8 & 15 Mailed
  • Oct 17
    2013
    Registered SEC 8 (6 Yr) Accepted & SEC 15 ACK
  • Oct 08
    2013
    Registered SEC 8 (6 Yr) & SEC 15 Filed
  • Oct 16
    2013
    Case Assigned To Post Registration Paralegal
  • Oct 08
    2013
    TEAS Section 8 & 15 Received
  • Oct 08
    2013
    TEAS Change Of Correspondence Received
  • Jan 13
    2010
    TEAS Change Of Correspondence Received
  • Jun 24
    2008
    Registered Principal Register
  • May 21
    2008
    Law Office Registration Review Completed
  • May 21
    2008
    Allowed Principal Register SOU Accepted
  • May 12
    2008
    Statement Of Use Processing Complete
  • Apr 22
    2008
    Use Amendment Filed
  • Apr 22
    2008
    Paper Received
  • Oct 23
    2007
    NOA Mailed SOU Required From Applicant
  • Jul 31
    2007
    Published For Opposition
  • Jul 11
    2007
    Notice Of Publication
  • May 10
    2007
    Law Office Publication Review Completed
  • May 10
    2007
    Assigned To LIE
  • Apr 23
    2007
    Approved For PUB Principal Register
  • Oct 02
    2006
    Letter Of Suspension Mailed
  • Oct 02
    2006
    Suspension Letter Written
  • Aug 31
    2006
    Amendment From Applicant Entered
  • Aug 28
    2006
    Correspondence Received In Law Office
  • Aug 28
    2006
    Paper Received
  • Mar 20
    2006
    Non Final Action Mailed
  • Mar 19
    2006
    Non Final Action Written
  • Mar 12
    2006
    Assigned To Examiner
  • Feb 08
    2006
    Applicant/Correspondence Changes (Non Responsive) Entered
  • Jan 27
    2006
    Paper Received
  • Sep 01
    2005
    New Application Entered In TRAM