E20



Trademark Coverage

No Class Specified

inspection modules for use with inspection equipment and devices, namely, equipment and devices that sense and/or capture images of semiconductor and electronic related components including semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and automatically inspect these images for information such as defects, coordinate or position determination, identification, and/or presence or absence of something thereon

Owner
Timeline
  • Feb 01
    2013
    Cancelled SEC 8 (6 Yr)
  • Jun 27
    2006
    Registered Principal Register
  • May 10
    2006
    Law Office Registration Review Completed
  • May 05
    2006
    Assigned To LIE
  • Apr 26
    2006
    Allowed Principal Register SOU Accepted
  • Apr 26
    2006
    Statement Of Use Processing Complete
  • Apr 11
    2006
    Use Amendment Filed
  • Apr 11
    2006
    TEAS Statement Of Use Received
  • Mar 23
    2006
    Assigned To Examiner
  • Jan 10
    2006
    NOA Mailed SOU Required From Applicant
  • Oct 18
    2005
    Published For Opposition
  • Sep 28
    2005
    Notice Of Publication
  • Aug 08
    2005
    Law Office Publication Review Completed
  • Aug 05
    2005
    Assigned To LIE
  • Aug 02
    2005
    Approved For PUB Principal Register
  • Aug 01
    2005
    Assigned To Examiner
  • Jan 10
    2005
    New Application Entered In TRAM