EXPLORER



Trademark Coverage

No Class Specified

System for optical semiconductor wafer inspection comprising interchangeable modules, each module being designed for a separate type of optical semiconductor wafer inspection and comprised of brightfield and darkfield illuminators, substrate moving arms, computers, software for controlling the operation thereof and evaluates results therefrom

Owner
Timeline
  • Jan 07
    2014
    Notice Of Acceptance Of SEC 8 & 15 E Mailed
  • Jan 07
    2014
    Registered SEC 8 (6 Yr) Accepted & SEC 15 ACK
  • Jan 02
    2014
    Registered SEC 8 (6 Yr) & SEC 15 Filed
  • Jan 07
    2014
    Case Assigned To Post Registration Paralegal
  • Jan 02
    2014
    TEAS Section 8 & 15 Received
  • Sep 09
    2008
    Registered Principal Register
  • Jun 24
    2008
    Published For Opposition
  • Jun 04
    2008
    Notice Of Publication
  • May 19
    2008
    Law Office Publication Review Completed
  • May 19
    2008
    Assigned To LIE
  • May 19
    2008
    Approved For PUB Principal Register
  • Feb 28
    2008
    TEAS/Email Correspondence Entered
  • Feb 28
    2008
    Correspondence Received In Law Office
  • Feb 28
    2008
    TEAS Response To Office Action Received
  • Feb 26
    2008
    Attorney Revoked And/Or Appointed
  • Feb 26
    2008
    TEAS Revoke/Appoint Attorney Received
  • Dec 21
    2007
    Notification Of Non Final Action E Mailed
  • Dec 21
    2007
    Non Final Action E Mailed
  • Dec 21
    2007
    Non Final Action Written
  • Dec 12
    2007
    Assigned To Examiner
  • Sep 11
    2007
    New Application Entered In TRAM